The 10th Multifrequency AFM Conference took place May 26-30th in Madrid, and NanoRAM was strongly presented by doctoral candidates Judith Zubia Aranburu (DC1), Luca Franco (DC2), Mina Orouji (DC4), José Huertas Pedroche (DC5), Madhura Bhaiyasaheb Bonde (DC6), Maria Jose Fernandez (DC11), Anna Pushkareva Fazullina (DC13) and Haishuo Guan (DC14), as well as supervisors Mingdong Dong, Ricardo Garcia, Georg Gramse, Hüsnü Aslan and Patrick Unwin. In continuation of the conference programme, NanoRAM hosted a graduate school on programming and machine learning for nanoimaging.

Hands-on session with Nanosurf

The training workshop began with a introduction to atomic force microscopy by Hans Gunstheimer and Jonathan Adams from Nanosurf. The talk especially focused on the importance of AFM system calibration for nanomechanical measurements, which is also one of the key pillars in NanoRAM’s scientific goals. Next, the DCs (and a few curious supervisors) scripted automated imaging routines in Python, which they subsequently used to run automated nanomechanical measurement of a polymer blend with a DriveAFM.

SPM machine learning

Gabriel Gomila, Professor at the Department of Electronics of the University of Barcelona, gave an exciting introduction to use of machine learning in scanning probe microscopy (SPM). SPM data set have evolved from simple topography images to multi-channel 3D data, and the recent improvements in imaging speed has led to the acquisition of large datasets necessitating autonomous batch processing. Prof. Gomila is also coordinating the Marie Curie Skłodowska Doctoral Network SPM4.0, and we foresee a strong collaboration between the two projects.